oMulti-Patterning Rules: Assigning diff masks to shapes based on adjacent mask, if it is odd cycle violation, loop violation.
- Via Rules:
- Via Stacking & Alignment: Very tight rules on stacking multiple vias and their alignment to metal layers above and below.
- Via Enclosure by Metal: Stricter metal enclosure around vias.
- Interconnect Rules:
- Minimum Metal Pitch: Extremely tight metal width and spacing rules.
- End-of-Line (EOL) Spacing: Specific, often larger, spacing required at the ends of metal lines.
- Complex Conditional Spacing: Spacing rules that change based on parallel run length, adjacent feature types, or layer.
- fixing-double-patterning-errors-at-20nm
